Capabilities

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Extended X-ray Absorption Fine Structure
Mercury intrusion porosimetry (MIP)
Dynamic Light Scattering (DLS) and UV-Vis
Density Measurement and Pyncometer
Titration
Focused ion beam (FIB)
Inductively-couple plasma-mass spectrometry (ICP-MS)
Ion Chromatography (IC)
Scanning electron microscopy (SEM)
Scanning transmission electron microscopy (STEM)
X-ray Absorption Spectroscopy (XAS)
X-ray fluorescence spectroscopy (XRF)
X-ray photoelectron spectroscopy (XPS)
X-ray Diffraction (benchtop, XRD)
Laser profilometer
Laser Diffraction
Ex situ infrared imaging with active excitation
Transmission electron microscopy (TEM)