Capabilities

Filter by component/material:

Filter by lab:

Filter by mode:

Filter by phenomena:

Filter by technique:

Grazing incidence X-ray scattering (GIXS) and X-ray Reflectometry for thin films and interfaces
Ionomer coverage using AC impedance
Dynamic Light Scattering (DLS) and UV-Vis
Rheometer
Quartz-Crystal Microbalance with Dissipation
Spectrocopic Ellipsometry for Supported Thin Films
Microelectrode system: electro-osmotic coefficient, gas permeability and solubility testing
ITC Calorimetry for ink interactions
Grazing incidence X-ray scattering (GIXS)
X-ray Absorption Spectroscopy (XAS)
Membrane and Ionomer modeling and data science
Thin Film Fabrication and Casting on Support
Incoporation of ionic liquids