Capabilities

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Mechanical Testing and Dynamic Mechanical Analysis
Titration
Ion Chromatography (IC)
Scanning electron microscopy (SEM)
Scanning transmission electron microscopy (STEM)
Energy Tunable X-ray scattering with Soft and Tender X-rays (RSoXS, T-Rex)
Small/Wide-Angle X-ray scattering (SAXS/WAXS) with hydration, heating or stretching
X-ray photoelectron spectroscopy (XPS)
X-ray Diffraction (benchtop, XRD)
Atomic Force Microscopy (AFM)
Laser profilometer
Small Angle Neutron Scattering (SANS), Neutron reflectometry (NR)
ATR-FTIR
Membrane performance-durability modeling
Electrospinning/electrospraying
Pressure reactor system
Roll-to-roll coater (slot die, gravure, multilayer slide die)
Transmission electron microscopy (TEM)
Spectrocopic Ellipsometry for Thin Film Expansion and Swelling with RH
Neutron reflectometry (NR)