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Fourier-transform infrared spectroscopy and ATR-FTIR
UV-Vis imaging , UV-Vis fluorescence and spectroscopy
Small Angle Neutron Scattering (SANS)
Neutron reflectometry (NR)
Small/Wide-Angle X-ray scattering (SAXS/WAXS) in-situ for nanostructure and crystallinity
Grazing incidence X-ray scattering (GIXS) and X-ray Reflectometry for thin films and interfaces
Accelerated Stress Testing (AST)
Scanning electron microscopy (SEM)
Scanning transmission electron microscopy (STEM)
Energy Tunable X-ray scattering with Soft and Tender X-rays (RSoXS, T-Rex)
Grazing incidence X-ray scattering (GIXS)
Small/Wide-Angle X-ray scattering (SAXS/WAXS) with hydration, heating or stretching
X-ray Absorption Spectroscopy (XAS)
X-ray photoelectron spectroscopy (XPS)
X-ray Diffraction (benchtop, XRD)
Atomic Force Microscopy (AFM)
Laser profilometer
Small Angle Neutron Scattering (SANS), Neutron reflectometry (NR)
ATR-FTIR
Transmission electron microscopy (TEM)