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Accelerated Stress Testing with in-situ reference electrodes (for Anode degredation)
Fourier-transform infrared spectroscopy and ATR-FTIR
UV-Vis imaging , UV-Vis fluorescence and spectroscopy
Small Angle Neutron Scattering (SANS)
Neutron reflectometry (NR)
Small/Wide-Angle X-ray scattering (SAXS/WAXS) in-situ for nanostructure and crystallinity
Grazing incidence X-ray scattering (GIXS) and X-ray Reflectometry for thin films and interfaces
Data-driven modeling for ionomer membranes
Truck system analysis
Accelerated Stress Testing (AST)
Bulk electrode limiting current
Local transport limiting current
CO Displacement Chronoamperometry
Operando electrochemical accessibility
Focused ion beam (FIB)
Micro and Nano- X-ray computed tomography (synchrotron)
Micro X-ray computed tomography (benchtop)
Neutron imaging/tomography
Scanning electron microscopy (SEM)
Scanning transmission electron microscopy (STEM)
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