Capabilities

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X-ray fluorescence spectroscopy (XRF)
Atomic Force Microscopy (AFM)
Laser profilometer
Electrode image reconstructon and transport modeling
Electrospinning/electrospraying
Ultrasonic spray
Sheet Autocoater (rod, blade, bar, etc.)
Roll-to-roll coater (slot die, gravure, multilayer slide die)
Transmission electron microscopy (TEM)
Microelectrode system: electro-osmotic coefficient, gas permeability and solubility testing, kinetics
Spectrocopic Ellipsometry for Thin Film Expansion and Swelling with RH
Fourier-transform infrared spectroscopy and ATR-FTIR
UV-Vis imaging , UV-Vis fluorescence and spectroscopy
Small Angle Neutron Scattering (SANS)
Neutron reflectometry (NR)
Small/Wide-Angle X-ray scattering (SAXS/WAXS) in-situ for nanostructure and crystallinity
Grazing incidence X-ray scattering (GIXS) and X-ray Reflectometry for thin films and interfaces
Data-driven modeling for ionomer membranes
In-situ Electrochemical ATR-FTIR
Dynamic Light Scattering (DLS) and UV-Vis