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Accelerated Stress Testing with in-situ reference electrodes (for Anode degredation)
Accelerated Stress Testing (AST)
Bulk electrode limiting current
Local transport limiting current
CO Displacement Chronoamperometry
Operando electrochemical accessibility
Mercury intrusion porosimetry (MIP)
Contact Angle - Sessile drop
Contact Angle - Sliding Angle Goniometer
Dynamic Light Scattering (DLS) and UV-Vis
Density Measurement and Pyncometer
Focused ion beam (FIB)
Ion Chromatography (IC)
Scanning electron microscopy (SEM)
Scanning transmission electron microscopy (STEM)
X-ray Absorption Spectroscopy (XAS)
X-ray fluorescence spectroscopy (XRF)
Atomic Force Microscopy (AFM)
Laser profilometer
Transmission electron microscopy (TEM)