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Capabilities
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Accelerated Stress Testing with in-situ reference electrodes (for Anode degredation)
Segmented cell testing
Accelerated Stress Testing (AST)
Accelerated Stress Testing with in-situ reference electrodes
In situ hydrogen crossover/IR imaging
Segmented cell
Focused ion beam (FIB)
Micro X-ray computed tomography (benchtop)
Neutron imaging/tomography
Scanning electron microscopy (SEM)
Scanning transmission electron microscopy (STEM)
X-ray fluorescence spectroscopy (XRF)
Ex situ infrared imaging with active excitation
Transmission electron microscopy (TEM)