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Accelerated Stress Testing with in-situ reference electrodes (for Anode degredation)
Accelerated Stress Testing (AST)
Thermo Gravametric Analysis (TGA-MS)
Contact Resistance
Contact Angle - Sessile drop
Titration
Ion Chromatography (IC)
Scanning electron microscopy (SEM)
X-ray photoelectron spectroscopy (XPS)
X-ray Diffraction (benchtop, XRD)
Atomic Force Microscopy (AFM)
Laser profilometer