Capabilities

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Accelerated Stress Testing with in-situ reference electrodes (for Anode degredation)
Cyclic Voltametry
Membrane Testing System and AC Impedance for Conductivity with Environmental Control
UV-Vis imaging , UV-Vis fluorescence and spectroscopy
Small Angle Neutron Scattering (SANS)
Neutron reflectometry (NR)
Extended X-ray Absorption Fine Structure
Accelerated Stress Testing (AST)
Rotating Disc Electrode (RDE)
Local transport limiting current
Contact Resistance
Focused ion beam (FIB)
Micro and Nano- X-ray computed tomography (synchrotron)
Micro X-ray computed tomography (benchtop)
Scanning electron microscopy (SEM)
Ultra-small, small, and wide-angle X-ray scattering (USAXS, SAXS, WAXS)
X-ray Absorption Spectroscopy (XAS)
X-ray fluorescence spectroscopy (XRF)
X-ray photoelectron spectroscopy (XPS)
X-ray Diffraction (benchtop, XRD)