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Micro X-ray computed tomography (benchtop)
Scanning electron microscopy (SEM)
X-ray fluorescence spectroscopy (XRF)
X-ray photoelectron spectroscopy (XPS)
X-ray Diffraction (benchtop, XRD)
Atomic Force Microscopy (AFM)
Laser profilometer
Small Angle Neutron Scattering (SANS), Neutron reflectometry (NR)
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Ex situ infrared imaging with active excitation
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Fast UV-Vis imaging , UV-Vis fluorescence and spectroscopy
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Strong electrostatic adsorption
MOF-based support synthesis
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