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Mercury intrusion porosimetry (MIP)
Contact Resistance
Contact Angle - Sessile drop
Contact Angle - Sliding Angle Goniometer
Density Measurement and Pyncometer
Micro and Nano- X-ray computed tomography (synchrotron)
Micro X-ray computed tomography (benchtop)
Laser profilometer
Microelectrode system: electro-osmotic coefficient, gas permeability and solubility testing, kinetics
Spectrocopic Ellipsometry for Thin Film Expansion and Swelling with RH
Fourier-transform infrared spectroscopy and ATR-FTIR
UV-Vis imaging , UV-Vis fluorescence and spectroscopy
Small Angle Neutron Scattering (SANS)
Neutron reflectometry (NR)
Small/Wide-Angle X-ray scattering (SAXS/WAXS) in-situ for nanostructure and crystallinity
Grazing incidence X-ray scattering (GIXS) and X-ray Reflectometry for thin films and interfaces
Data-driven modeling for ionomer membranes
Ionomer coverage using AC impedance
In-situ Electrochemical ATR-FTIR
Dynamic Light Scattering (DLS) and UV-Vis
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