Capabilities

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UV-Vis imaging , UV-Vis fluorescence and spectroscopy
Small Angle Neutron Scattering (SANS)
Neutron reflectometry (NR)
Small/Wide-Angle X-ray scattering (SAXS/WAXS) in-situ for nanostructure and crystallinity
Grazing incidence X-ray scattering (GIXS) and X-ray Reflectometry for thin films and interfaces
Extended X-ray Absorption Fine Structure
Contact Angle - Sessile drop
Contact Angle - Sliding Angle Goniometer
Focused ion beam (FIB)
Micro and Nano- X-ray computed tomography (synchrotron)
Micro X-ray computed tomography (benchtop)
Scanning electron microscopy (SEM)
Scanning transmission electron microscopy (STEM)
Ultra-small, small, and wide-angle X-ray scattering (USAXS, SAXS, WAXS)
Energy Tunable X-ray scattering with Soft and Tender X-rays (RSoXS, T-Rex)
Small/Wide-Angle X-ray scattering (SAXS/WAXS) with hydration, heating or stretching
X-ray Absorption Spectroscopy (XAS)
X-ray fluorescence spectroscopy (XRF)
X-ray photoelectron spectroscopy (XPS)
X-ray Diffraction (benchtop, XRD)