Capabilities

Filter by component/material:

Filter by lab:

Filter by mode:

Filter by phenomena:

Filter by technique:

Accelerated Stress Testing with in-situ reference electrodes (for Anode degredation)
Cyclic Voltametry
Accelerated Stress Testing (AST)
Bulk electrode limiting current
Local transport limiting current
Ionomer coverage using AC impedance
CO Displacement Chronoamperometry
Operando electrochemical accessibility
Mercury intrusion porosimetry (MIP)
Contact Angle - Sessile drop
Contact Angle - Sliding Angle Goniometer
Density Measurement and Pyncometer
Dynamic Vapor Sorption and Water Uptake
Conductivity: Membrane Testing System and AC Impedance
Focused ion beam (FIB)
Ion Chromatography (IC)
Micro and Nano- X-ray computed tomography (synchrotron)
Scanning electron microscopy (SEM)
Scanning transmission electron microscopy (STEM)
Ultra-small, small, and wide-angle X-ray scattering (USAXS, SAXS, WAXS)