Capabilities

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Focused ion beam (FIB)
Scanning electron microscopy (SEM)
Scanning transmission electron microscopy (STEM)
X-ray photoelectron spectroscopy (XPS)
Transmission electron microscopy (TEM)
Accelerated Stress Testing with in-situ reference electrodes (for Anode degredation)
Segmented cell testing
Cyclic Voltametry
Mechanical Testing: Force Tensiometer
Water mobility, water permeability
Fourier-transform infrared spectroscopy and ATR-FTIR
UV-Vis imaging , UV-Vis fluorescence and spectroscopy
Accelerated Stress Testing (AST)
Accelerated Stress Testing with in-situ reference electrodes
In situ hydrogen crossover/IR imaging
Segmented cell
Rotating Disc Electrode (RDE)
Bulk electrode limiting current
Local transport limiting current
Ionomer coverage using AC impedance