Capabilities

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UV-Vis imaging , UV-Vis fluorescence and spectroscopy
Small Angle Neutron Scattering (SANS)
Neutron reflectometry (NR)
Small/Wide-Angle X-ray scattering (SAXS/WAXS) in-situ for nanostructure and crystallinity
Grazing incidence X-ray scattering (GIXS) and X-ray Reflectometry for thin films and interfaces
Data-driven modeling for ionomer membranes
Focused ion beam (FIB)
Micro X-ray computed tomography (benchtop)
Neutron imaging/tomography
Scanning electron microscopy (SEM)
Scanning transmission electron microscopy (STEM)
Energy Tunable X-ray scattering with Soft and Tender X-rays (RSoXS, T-Rex)
X-ray Absorption Spectroscopy (XAS)
X-ray fluorescence spectroscopy (XRF)
Ex situ infrared imaging with active excitation
Electrode image reconstructon and transport modeling
Transmission electron microscopy (TEM)