Capabilities

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Accelerated Stress Testing with in-situ reference electrodes (for Anode degredation)
Segmented cell testing
Fourier-transform infrared spectroscopy and ATR-FTIR
UV-Vis imaging , UV-Vis fluorescence and spectroscopy
Small Angle Neutron Scattering (SANS)
Neutron reflectometry (NR)
Small/Wide-Angle X-ray scattering (SAXS/WAXS) in-situ for nanostructure and crystallinity
Grazing incidence X-ray scattering (GIXS) and X-ray Reflectometry for thin films and interfaces
Extended X-ray Absorption Fine Structure
Accelerated Stress Testing (AST)
Accelerated Stress Testing with in-situ reference electrodes
In situ hydrogen crossover/IR imaging
Segmented cell
Bulk electrode limiting current
Local transport limiting current
CO Displacement Chronoamperometry
Operando electrochemical accessibility
Focused ion beam (FIB)
Micro and Nano- X-ray computed tomography (synchrotron)
Micro X-ray computed tomography (benchtop)