Capabilities

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Focused ion beam (FIB)
Micro and Nano- X-ray computed tomography (synchrotron)
Micro X-ray computed tomography (benchtop)
Scanning electron microscopy (SEM)
Scanning transmission electron microscopy (STEM)
Ultra-small, small, and wide-angle X-ray scattering (USAXS, SAXS, WAXS)
X-ray fluorescence spectroscopy (XRF)
Atomic Force Microscopy (AFM)
Laser profilometer
Transmission electron microscopy (TEM)