Capabilities

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Fourier-transform infrared spectroscopy and ATR-FTIR
Small/Wide-Angle X-ray scattering (SAXS/WAXS) in-situ for nanostructure and crystallinity
Grazing incidence X-ray scattering (GIXS) and X-ray Reflectometry for thin films and interfaces
Focused ion beam (FIB)
Scanning electron microscopy (SEM)
Scanning transmission electron microscopy (STEM)
Energy Tunable X-ray scattering with Soft and Tender X-rays (RSoXS, T-Rex)
Grazing incidence X-ray scattering (GIXS)
Small/Wide-Angle X-ray scattering (SAXS/WAXS) with hydration, heating or stretching
X-ray photoelectron spectroscopy (XPS)
Transmission electron microscopy (TEM)