Capabilities

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UV-Vis imaging , UV-Vis fluorescence and spectroscopy
Small Angle Neutron Scattering (SANS)
Neutron reflectometry (NR)
Contact Resistance
Focused ion beam (FIB)
Micro X-ray computed tomography (benchtop)
Scanning electron microscopy (SEM)
X-ray fluorescence spectroscopy (XRF)
X-ray photoelectron spectroscopy (XPS)
X-ray Diffraction (benchtop, XRD)
Laser profilometer
Small Angle Neutron Scattering (SANS), Neutron reflectometry (NR)